| 报告人：Prof. Chiang Fu-pen, SUNY Distinguished Professor 报告人单位：Stony Brook University 报告时间：2013年11月4日，下午13:00-15:00 报告地点：图文信息中心第一会议室 主办单位：机械学院、光电学院 报告摘要： 早期的应力应变全场测量分析光学技术是光弹方法，它可以追溯到麦克斯伟所处的时代。上个世纪六十年代莫尔条纹技术兴起，接着就是全息干涉术，以后发展起来的是散斑方法。为了对于应力应变做全场的定量测量分析，散斑技术，尤其是数码相机和高速计算机出现以后，变得更加多样化。纳米散斑测量技术引入以后，散斑照相束的分辨率提高了若干个数量级。在这次讲座中，Prof. Chiang将详细介绍这方面几种主要测量技术方法，并讨论它们各自的优缺点。（The earliest full-field optical technique for stress/strain analysis is photoelasticity, which can be traced back to the days of James Maxwell.In 1960, a flurry of moire techniques were developed. Then came the technique of holographic interferometry followed by speckle methods. For the purpose of quantitative stress/strain analysis, the speckle techniques are the most versatile, especially after the advent ofdigital cameras and high speed computers. The introduction of nanospeckles has extended the spatial resolution of the speckle photography technique several orders of magnitude. In this presentation, I shall detail all the major techniques and point out their advantages and disadvantages.） | 
